The Characteristics Depending on the Annealing Conditions in the PDP Vacuum In-line Sealing

  • Kwon, Sang-Jik (Dept. of Electronics Eng., Kyungwon University) ;
  • Kim, Jee-Hoon (Dept. of Electronics Eng., Kyungwon University) ;
  • Jang, Chan-Kyu (Dept. of Electronics Eng., Kyungwon University) ;
  • Park, Sung-Hyun (Dept. of Electronics Eng., Kyungwon University) ;
  • Whang, Ki-Woong (School of Electrical Engineering, College of Engineering, Seoul National University) ;
  • Lee, Kyung-Wha (School of Electrical Engineering, College of Engineering, Seoul National University)
  • Published : 2004.08.23

Abstract

This paper deals with the various sealing conditions in a vacuum and the discharge characteristics. The MgO thin film is prepared by e-beam evaporation method. Sealing process was performed in a vacuum at panel temperature of 430 $^{\circ}C$. We find the cracks on the MgO film surface, which results in higher discharge voltage and lower luminous efficiency. The vacuum in-line sealing technology does not require additional annealing process but induces the MgO cracks because of the high temperature sealing cycle in a vacuum. Therefore we modify the vacuum in-line sealing cycle which the MgO cracks are not found and the good characteristics of plasma displays are found in higher sealing pressure at sealing temperature of 430 $^{\circ}C$.

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