한국정보디스플레이학회:학술대회논문집
- 2004.08a
- /
- Pages.623-624
- /
- 2004
Apparatus and Method of Visual Lifetime Measurement of Organic Light Emitting Devices
-
Yang, Yong-Suk
(Electronics and Telecommunications Research Institute)
;
-
Chu, Hye-Yong
(Electronics and Telecommunications Research Institute)
;
- Oh, Ji-Young (Electronics and Telecommunications Research Institute) ;
-
Lee, Jeong-Ik
(Electronics and Telecommunications Research Institute)
;
- Kim, Gi-Heon (Electronics and Telecommunications Research Institute) ;
- KoPark, Sang-He (Electronics and Telecommunications Research Institute) ;
-
Hwang, Chi-Sun
(Electronics and Telecommunications Research Institute)
;
- Kim, Mi-Kyung (Electronics and Telecommunications Research Institute) ;
- Do, Lee-Mi (Electronics and Telecommunications Research Institute) ;
- Chung, Sung-Mook (Electronics and Telecommunications Research Institute) ;
- Ko, Young-Wook (Electronics and Telecommunications Research Institute)
- Published : 2004.08.23
Abstract
The coating and estimation of gas and moisture barriers on polymer and glass substrates are receiving very much attention in passivation of organic light emitting devices (OLEDs). In this study, the encapsulation and lifetime measurement techniques of OLEDs were presented. The degradation mechanisms of bare and encapsulated OLEDs were investigated by the visual lifetime measurement (VLM) system with the parameters such as a pixel luminance(L), a luminance rms roughness(dL), a brightness area ratio(R), an edge degradation depth(D), etc.
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