한국윤활학회:학술대회논문집 (Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference)
- 한국윤활학회 2004년도 학술대회지
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- Pages.283-288
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- 2004
A Study on the Measurement for the Nano Scale Film Formation of Ultra Low Aspect Ratio
- Jang Siyoul (School of Mechanical & Automotive Engineering, Kookmin University) ;
- Kong Hyunsang (Graduate School of Automotive Engineering, Kookmin University)
- 발행 : 2004.11.01
초록
The measurement of ultra low aspect ratio fluid film thickness is very crucial technique both for the verification of lubrication media characteristics and for the clearance design in many precision components such as MEMS, precision bearings and other slideways. Many technologies are applied to the measurement of ultra low aspect ratio fluid film thickness (i.e. elastohydrodynamic lubrication film thickness). In particular, in-situ optical interferometric method has many advantages in making the actual contact behaviors realized with the experimental apparatus. This measurement method also does the monitoring of the surface defects and fractures happening during the contact behavior, which are delicately influenced by the surface conditions such as load, velocity, lubricant media as well as surface roughness. Careful selection of incident lights greatly enhances the fringe resolutions up to
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