Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2004.07b
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- Pages.784-789
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- 2004
Degradation Mechanism of single grain boundary in Zno Varistor
ZnO 바리스터 단입계의 열화 메카니즘
- Kim, Jong-Ho (Wonkwang Uni. Department of Electrical, Electronic and Information Engineering Kwangwoon Uni.) ;
- Lim, Keun-Young (Wonkwang Uni. Department of Electrical, Electronic and Information Engineering Kwangwoon Uni.) ;
- Kim, Jin-Sa (Kwangwoon Uni. Department of Electrical Engineering) ;
- Park, Choon-Bae (Wonkwang Uni. Department of Electrical, Electronic and Information Engineering Kwangwoon Uni.)
- Published : 2004.07.05
Abstract
Bulk ZnO varistor based on Matsuoka, which varied