Fabrication and Characterization of $High-T_c$ Superconducting Single Channel Flux Flow Transistor using the Atomic Force Microscope TiO Cantilever Tip

원자힘 주사현미경 TiO 탐침을 이용한 고온 초전도 단일채널 자속 흐름 트랜지스터의 제작 및 특성 해석

  • 고석철 (전북대 전기공학과) ;
  • 강형곤 (전북대 기초과학지원연구원) ;
  • 임성훈 (전북대 공업기술연구센터) ;
  • 이종화 (전북대 전기공학과) ;
  • 이해성 (한국기초과학지원연구원 전주분소) ;
  • 한병성 (전북대 전기공학과)
  • Published : 2004.07.05

Abstract

We have fabricated a channel of superconducting flux flow transistor(SFFT) using the voltage-biased atomic force microscope(AFM) TiO tip and performed numerical simulations for the SFFT controlled by the magnetic field with a control current. The critical current density in a channel of the fabricated SFFT was decreased with the applied current by a control line. By comparing the measured with theoretical results, we showed a possibility of fabrication of an SFFT with a nano-channel using AFM anodization process technique.

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