한국신뢰성학회:학술대회논문집 (Proceedings of the Korean Reliability Society Conference)
- 한국신뢰성학회 2004년도 정기학술대회
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- Pages.193-200
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- 2004
TIGHTENED CRITICAL VALUE DEGRADATION TEST
- Jang, J.S. (Div. of Industrial ＆ Information System Eng., Ajou Univ.) ;
- Jang, S.J. (Div. of Industrial ＆ Information System Eng., Ajou Univ.) ;
- Park, B.H. (Div. of Industrial ＆ Information System Eng., Ajou Univ.) ;
- Lim, H.K. (Div. of Industrial ＆ Information System Eng., Ajou Univ.)
- 발행 : 2004.07.01
초록
Determination of sample sizes and the inspection intervals for degradation tests is considered. The cases of degradation rate model and degradation path model are analyzed with some examples. Tightened critical value tests are also considered that are shown to be advantageous over non-tightened ones.
키워드