Thickness and Annealing Temperature Dependences of [CoFe/Pt] Multilayers Exchange-Coupled by NiO Films

• Kim S. W. (Department of Physics, Dankook university) ;
• Choi J. G. (Department of Computer and Electronics, Sangji University) ;
• Lee J. Y. (Department of Computer and Electronics, Sangji University) ;
• Kim M. S. (Department of Computer and Electronics, Sangji University) ;
• Lee S. S. (Department of Computer and Electronics, Sangji University) ;
• Hwang D. G. (Department of Computer and Electronics, Sangji University)

• 김선욱 (단국대학 물리학과) ;
• 최종구 (상지대학교 컴퓨터전자물리학과) ;
• 이진용 (상지대학교 컴퓨터전자물리학과) ;
• 김미선 (상지대학교 컴퓨터전자물리학과) ;
• 이상석 (상지대학교 컴퓨터전자물리학과) ;
• 황근 (상지대학교 컴퓨터전자물리학과)

• Published : 2004.06.01

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