Proceedings of the Korean Ceranic Society Conference (한국세라믹학회:학술대회논문집)
- 2003.04a
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- Pages.170.2-170
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- 2003
Effects of $LaNiO_3$ Buffer Layers Thickness on the Ferroelectric Properties of PZT Thin Film
- Kim, Hee-San (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
- Kim, J.H. (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
- Choo, W.K. (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology)
- Published : 2003.04.18
Abstract
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