Measurement of ion-induced secondary electron emission coefficient for MgO thin film with plasma treatment

• 정혜선 ;
• 오준석 ;
• 정재천 ;
• 박원배 ;
• 임재용 ;
• 조재원 ;
• 최은하

• Jeong, Hye-Seon (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
• O, Jun-Seok (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
• Jeong, Jae-Cheon (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
• Park, Won-Bae (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
• Im, Jae-Yong (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
• Jo, Jae-Won (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
• Choe, Eun-Ha (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University)

• 발행 : 2003.02.14

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