Critical Current Degradation Characteristics by Temperature Difference of $LN_2$ -Normal in Bending Strain of High Temperature Superconducting Tapes
- Kim, H.Joon. (Korea Electrotechnology Research Institute(KERI)) ;
- Sim, K.D. (Korea Electrotechnology Research Institute(KERI)) ;
- Cho, J.W. (Korea Electrotechnology Research Institute(KERI)) ;
- Joo, J.H. (Korea Electrotechnology Research Institute(KERI)) ;
- Kim, H.J. (Korea Electrotechnology Research Institute(KERI)) ;
- Bae, J.H. (Korea Electrotechnology Research Institute(KERI))
- Published : 2003.08.18
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