한국정보디스플레이학회:학술대회논문집
- 2003.07a
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- Pages.802-805
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- 2003
Measurement of ion-induced secondary electron emission coefficient for MgO thin film with $O_{2}$ plasma treatment
- Jeong, H.S. (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
- Oh, J.S. (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
- Lim, J.Y. (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
- Cho, J.W. (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University) ;
- Choi, E.H. (Charged Particle Beam and Plasma Laboratory / PDP Research Center, Department of Electrophysics, Kwangwoon University)
- Published : 2003.07.09
Abstract
The ion-induced secondary electron emission coefficient
Keywords