Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2003.11a
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- Pages.490-493
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- 2003
The characteristics of holographic diffraction efficiency depend on thickness of Ag in AsGeSeS/Ag thin film
AsGeSeS/Ag 박막에서 Ag의 두께에 따른 홀로그래픽 회절 효율 특성
- Lee, Jung-Tae (Department of Electronic Materials Eng. Kwangwoon Unuv.) ;
- Lee, Ki-Nam (Department of Electronic Materials Eng. Kwangwoon Unuv.) ;
- Yeo, Cheol-Ho (Department of Electronic Materials Eng. Kwangwoon Unuv.) ;
- Lee, Yeong-Jong (Department of Electronic Eng. Yeojoo Univ.) ;
- Chung, Hong-Bay (Department of Electronic Materials Eng. Kwangwoon Unuv.)
- 이정태 (광운대학교 전자재료공학과) ;
- 이기남 (광운대학교 전자재료공학과) ;
- 여철호 (광운대학교 전자재료공학과) ;
- 이영종 (여주대학교 전자과) ;
- 정흉배 (광운대학교 전자재료공학과)
- Published : 2003.11.13
Abstract
We have carried out two-beam interference experiment to form holographic grating on amorphous
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