Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2003.11a
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- Pages.460-463
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- 2003
Characterization of thin film properties of Copper(II)-Phthalocyanine using a near-field scanning microwave microscope
근접장 마이크로파 현미경을 이용한 Copper(II)-phthalocyanine 박막의 특성 연구
- Park, Mie-Hwa (Seokang Univ.) ;
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Lee, Kie-Jin
(Seokang Univ.)
- Published : 2003.11.13
Abstract
We report the microwave reflection coefficient
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