Monte-Carlo Simulation on Properties of X-ray Detector with Multi-layer Structure

몬테카를로 시뮬레이션을 통한 다층 구조 엑스선 검출기의 특성 평가

  • 신정욱 (인제대학교 의용공학과) ;
  • 박지군 (인제대학교 의용공학과) ;
  • 석대우 (인제대학교 의용공학과) ;
  • 이채훈 (인제대학교 의용공학과) ;
  • 김재형 (인제대학교 의료영상연구소) ;
  • 남상희 (인제대학교 의료영상연구소)
  • Published : 2003.11.13

Abstract

The properties of digital X-ray detectors depend on the absorption extent of X-rays, the generated signal of each X-ray photon and the distribution of the generated signal between pixels. In digital X-ray detector with single layer, signal is generated by X-ray photon captured in photoconductor. In X-ray detector with multi structure that scintillator formed above the top of photoconductor, signal is generated both by X-ray photon captured each in scintillator and photoconductor. X-ray detector with multi structure is generated more signal than single layer detector. In this paper, we simulated absorption fraction of X-ray detector with multi-layer using Monte Carlo program. The results compared with single-layer detector to be formed scinillator or photoconductor.

Keywords