한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.2
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- Pages.826-829
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- 2003
M/CGS 이중구조를 갖는 박막소자의 온도특성분석
The Analysis of temperature characteristics on M/CGS thin film devices
- Kwon, Y.H. (Suwon Univ.) ;
- Moon, H.D. (Suwon Univ.) ;
- Kim, H.Y. (Suwon Univ.) ;
- Kim, Y.H. (Suwon Univ.)
- 발행 : 2003.07.10
초록
Metal/chalcogenide glass semiconductor(CGS) thin film devices were produced in the vacuum evaporator by the methode of vacuum thermal evaporation. We investigated the influence of the correlations of thickness of metal and CGS upon the concentration of Metal in a CGS thin film. It has shown that M/CGS thin film devices were very sensitive to temperature.
키워드