Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2003.07b
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- Pages.826-829
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- 2003
The Analysis of temperature characteristics on M/CGS thin film devices
M/CGS 이중구조를 갖는 박막소자의 온도특성분석
- Kwon, Y.H. (Suwon Univ.) ;
- Moon, H.D. (Suwon Univ.) ;
- Kim, H.Y. (Suwon Univ.) ;
- Kim, Y.H. (Suwon Univ.)
- Published : 2003.07.10
Abstract
Metal/chalcogenide glass semiconductor(CGS) thin film devices were produced in the vacuum evaporator by the methode of vacuum thermal evaporation. We investigated the influence of the correlations of thickness of metal and CGS upon the concentration of Metal in a CGS thin film. It has shown that M/CGS thin film devices were very sensitive to temperature.
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