Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2003.07a
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- Pages.416-419
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- 2003
The study of phase-change according to temperature and voltage in chalcogenide thin film
칼코게나이드 박막의 온도, 전압에 따른 상변화에 관한 연구
- Yang, Sung-Jun (Department of Electronic Materials Eng. Kwangwoon Univ.) ;
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Shin, Kyung
(Department of Electronic Materials Eng. Kwangwoon Univ.) ;
- Park, Jung-Il (Department of Electronic Materials Eng. Kwangwoon Univ.) ;
- Nam, Lee-Ki (Department of Electronic Materials Eng. Kwangwoon Univ.) ;
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Chung, Hong-Bay
(Department of Electronic Materials Eng. Kwangwoon Univ.)
- 양성준 (광운대학교 전자재료공학과) ;
-
신경
(광운대학교 전자재료공학과) ;
- 박정일 (광운대학교 전자재료공학과) ;
- 이기남 (광운대학교 전자재료공학과) ;
-
정홍배
(광운대학교 전자재료공학과)
- Published : 2003.07.10
Abstract
There is a growing need for a nonvolatile memory technology with faster speed than existing nonvolatile memories. We studied of phase-change according to temperature and voltage in chalcogenide thin film base on