Critical Current Degradation Characteristics by Temperature Difference of L$N_2$-Normal in Repetitive Bending Strain of High Temperature Superconducting Tape

고온 초전도 선재의 굽힘횟수와 온도차에 의한 임계전류저하특성

Critical current(Ic) degradation of HTS tapes after bending is one of the hottest issues in HTS development and application studies. Many people are measuring Ic degradations for effect of bending radius. However even if the bending radius is larger than the breaking radius a HTS tapes can be damaged by repetitive bending, which is unavoidable in the winding processes. Therefore, We studied the Ic degradation after repetitive bending. at 77K with self-field, of Bi-2223 tapes processed by "Powder-in-Tube" technique, which was made by America Superconductor Corporation(AMSC) and superconductiing tapes that strain is imposed measured critical current by temperature difference of L$N_2$ and normal temperature. Like this, critical current could measure that degradation about 1~3％ by temperature difference. These results will amount the most important basis data in power electric machine of superconductivity cable, magnet, etc that winding work is require.