Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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CLASSIFIED ELGEN BLOCK: LOCAL FEATURE EXTRACTION AND IMAGE MATCHING ALGORITHM

  • Hochul Shin (Visual Communications Lab., Department of EECS Korea Advanced Institute of Science and Technology) ;
  • Kim, Seong-Dae (Visual Communications Lab., Department of EECS Korea Advanced Institute of Science and Technology)
  • Published : 2003.07.01
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Abstract

This paper introduces a new local feature extraction method and image matching method for the localization and classification of targets. Proposed method is based on the block-by-block projection associated with directional pattern of blocks. Each pattern has its own eigen-vertors called as CEBs(Classified Eigen-Blocks). Also proposed block-based image matching method is robust to translation and occlusion. Performance of proposed feature extraction and matching method is verified by the face localization and FLIR-vehicle-image classification test.

Keywords