Proceedings of the Korea Institute of Convergence Signal Processing (융합신호처리학회 학술대회논문집)
- 2003.06a
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- Pages.256-261
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- 2003
A Study on the Design of Circuits for DC parameter Inspection
DC parameter 검사회로 설계에 관한 연구
Abstract
A memory industry is developing rapidly according to the period of the ubiquitous to approach. According to the development of a memory industry, the efficiency of the manufacture is becoming the serious consideration. DC parameter test system was a development low in this research for an efficiency increase of the manufacture. DC parameter test system increase of the manufacture. In the method to measure the output after permit volt and current at element.
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