Leakage Current Behavior of PZT Ferroelectric Thin Films on Annealed $LaNiO_3$ Bottom Electrodes

  • Kim Heesan (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
  • Kim Jai-Hyun (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
  • Choo Woong Kil (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology)
  • 발행 : 2003.12.01