한국자기학회:학술대회 개요집 (Proceedings of the Korean Magnestics Society Conference)
- 한국자기학회 2003년도 somma/kms meeting
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- Pages.97-97
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- 2003
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- 2233-9485(pISSN)
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- 2233-9574(eISSN)
Remanence analysis of sub-micron MTJ cells with CoFe/NiFe free layers
- Hwang, In-Jun (Materials and Devices Laboratory, Samsung Advanced Institute of Technology) ;
- Park, Wan-Jun (Materials and Devices Laboratory, Samsung Advanced Institute of Technology) ;
- Park, Sang-Jin (Materials and Devices Laboratory, Samsung Advanced Institute of Technology) ;
- Kim, Tae-Wan (Materials and Devices Laboratory, Samsung Advanced Institute of Technology) ;
- Kim, Young-Keun (Division of Materials Science and Engineering, Korea University)
- 발행 : 2003.12.01