Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
권호 표지

Characteristic of Critical Current after Repetitive Bending for High Superconducting Tapes

고온초전도 선재의 Bending횟수에 따른 임계전류의 특성

  • Kim, Hae-Joon (Korea. Electrotechnology Research Institute(KERI)) ;
  • Joo, J.H. (Korea. Electrotechnology Research Institute(KERI)) ;
  • Kim, S.W. (Korea. Electrotechnology Research Institute(KERI)) ;
  • Kim, H.J. (Korea. Electrotechnology Research Institute(KERI)) ;
  • Bae, J.H. (Korea. Electrotechnology Research Institute(KERI)) ;
  • Cho, J.W. (Korea. Electrotechnology Research Institute(KERI)) ;
  • Seong, K.C. (Korea. Electrotechnology Research Institute(KERI))
  • Published : 2003.07.21
Download PDF
⟨ Previous Next ⟩

Abstract

Critical current($I_c$) degradation of HTS tapes after bending is one of the holiest issues in HTS development and application studies. Many people are measuring $I_c$ degradations for effect of tending radius. However even if the bending radius is larger than the breaking radius a HTS tapes can be damaged by repetitive bending, which is unavoidable in the winding processes. Therefore, We studied the $I_c$ degradation after repetitive bending, at 77K with self-field, of Bi-2223 tapes processed by "Powder-in-Tube" technique, which was made by America Superconductor Corporation(AMSC), Innova Superconductor Technology(InnoST) and Korea Electro-technology Research Institute(KERI). For each specimen $I_c$ degradation was measured various bending radius as function of repetitive bending number.

Keywords