Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2003.07c
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- Pages.1759-1761
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- 2003
The Analysis of Patten on Trouble Signal defected in the DS of 170kv GIS
170kV GIS 단로기 이상신호 패턴분석
- Kim, Jong-Seo (Electrical Safety Research Institute) ;
- Cheon, Jong-Cheol (Electrical Safety Research Institute) ;
- Lee, Eun-Suk (Electrical Safety Research Institute)
- Published : 2003.07.21
Abstract
Recently, the development of diagnosis technique with high confidence is important on power equipment, for this reason is use for measurement and analysis of PD with prior appearance of insulation breakdown In this paper, we presents the analysis of trouble signal to use
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