Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2003.07d
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- Pages.2014-2016
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- 2003
A new residual generator for a Process FDIS
공정고장 검출식별시스템을 위한 잔차발생기구
- Lee, Kee-Sang (Dankook Univ.) ;
- Park, Tae-Geon (Chungbuk Provincial Univ. of S&T) ;
- Lee, Sang-Moon (Dankook Univ.)
- Published : 2003.07.21
Abstract
A new residual generation scheme that can be employed in the process fault detection and isolation systems for linear (control) systems is suggested. The scheme is very simple, but provides the same information for the detection and isolation of the anticipated faults as the conventional multiple observer based schemes. Application results show the practical feasibility of the proposed scheme.
Keywords