Deposition and evaluation of MoNx films deposited by magnetron sputtering

  • Ma, Yajun (State Key Laboratory of Tribology, Tsinghua University) ;
  • Li, Shenghua (State Key Laboratory of Tribology, Tsinghua University) ;
  • Jin, Yuansheng (State Key Laboratory of Tribology, Tsinghua University) ;
  • Pan, Guoshun (State Key Laboratory of Tribology, Tsinghua University) ;
  • Wang, Yucong (Gernal Motors Corporation) ;
  • Tung, Simon C. (Gernal Motors Corporation)
  • Published : 2002.10.21

Abstract

Molybdenum Nitrided (MoNx) films were deposited by DC planar magnetron sputtering. Silicon wafers and real nitrided stainless steel piston rings are employed as substrates. 12 different combinations of nitrogen and argon partial pressure, from 1:7 to 7:1, were applied to deposit MoNx films. X-ray diffraction (XRD) was used to determine the phase structures of films. When nitrogen vs. argon partial pressure is 1:7, the film is mainly $Mo_2N$ phase. With increase of nitrogen partial pressure, MoN phase emerges, but $Mo_2N$ phase still exists. Composition analysis with atomic emission spectrometry (AES) also agreed with this. The films have very high nanohardness (max 2400Hv) and good adhesion to the substrates.

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