한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2002년도 제4회 영호남학술대회 논문집
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- Pages.109-122
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- 2002
$Al_{2}O_{3}$ Crystal Capacitor를 이용한 유전손실 측정
Dielectric Loss Tangent Measurement Using the $Al_{2}O_{3}$ Crystal Capacitor
- 발행 : 2002.08.24
초록
The standard capacitor must have not only precise value of the capacitance but also the basic properties of low dielectric loss tangent. In the reforming process of capacitors, the dielectric loss tangent must be also reformed. In this paper, the development of standard capacitors of 10 and 100pF for the dielectric loss tangent standard using
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