Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2002.08a
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- Pages.109-122
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- 2002
Dielectric Loss Tangent Measurement Using the $Al_{2}O_{3}$ Crystal Capacitor
$Al_{2}O_{3}$ Crystal Capacitor를 이용한 유전손실 측정
- Published : 2002.08.24
Abstract
The standard capacitor must have not only precise value of the capacitance but also the basic properties of low dielectric loss tangent. In the reforming process of capacitors, the dielectric loss tangent must be also reformed. In this paper, the development of standard capacitors of 10 and 100pF for the dielectric loss tangent standard using
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