Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Relationships between MgO Manufacturing condition and Misfiring in low temperature

저온에서 AC PDP의 MgO 증착 조건과 방전 안정성 대한 연구

  • Ryu, S.N. (Pusan National University Electric Department) ;
  • Shin, M.K. (Pusan National University Electric Department) ;
  • Kim, Y.K. (Pusan National University Electric Department) ;
  • Shin, J.H. (Dong-eui University) ;
  • Yu, C.H. (Dong-eui University) ;
  • Kim, D.H. (Pusan National University Electric Department) ;
  • Lee, H.J. (Pusan National University Electric Department) ;
  • Park, C.H. (Pusan National University Electric Department)
  • Published : 2002.05.11
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Abstract

This paper deals with the relationships between MgO manufacturing condition and misfiring at low temperature. The characteristics of MgO are affected by substrate temperature and MgO deposition current. In this study. the. substrate temperature was varied from $100^{\circ}C$ to $200^{\circ}C$. And the MgO deposition current was varied from 5mA to 20mA. As a result. the misfiring at low temperature was decreased in the panels with substrate temperature $200^{\circ}C$ and MgO deposition current 5mA. These results may be explained that the higher substrate temperature and lower MgO deposition current makes the denser film formation.

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