Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2002.05a
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- Pages.35-39
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- 2002
Defect detection for a conductor using amorphous wire sensor head
금석 구조체의 미소결함검사에 대한 기초적인 검토
- Kim, Y.H. (Department of Electrical Engineering, Pukyong National University) ;
- Shin, K.H. (Division of Information and Science, Kyungsung University)
- Published : 2002.05.11
Abstract
A defect detection test was performed for a conductor using a amorphous wire sensor head. A uniform magnetic field was applied in the space between the most inner conductors of a spiral-typed coil. The conductor with a defect was placed on the space between the most inner conductors of spiral-typed coil. The defect can be detected from the differences of induced voltage measured in the vicinity of gap of the conductor. The induced voltage difference of 2.5mV was measured in the gap vicinity of the 1mm thick conductor having 0.5mm gap in the frequency region of 100kHz~600kHz.
아몰퍼스 자성와이어를 센서헤드로 이용한 금속 구조체의 미세결함 검사에 대해 검토하였다. 측정 방법은 스파이럴 코일의 균일 자장범위에 직선 갭을 가진 동판을 놓고 갭 주위를 관통하는 자속량의 차이를 센서헤드의 유기전압으로 측정하는 것이다. 이 결과 두께 1mm, 갭폭 0.5mm의 동판에 대해 100kHz~600kHz의 주라수 범위에 있어서 갭 근방에서 약 2.5mV의 전압차가 얻어져 결함의 유무를 확인할 수 있었다.
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