한국전자현미경학회:학술대회논문집

Korean Society of Microscopy (한국현미경학회)
권호 표지

Nano-probe TEM analyses for thin films and quantum devices

  • Suh, Ju-Hyung (Dept. of Materials Science and Engineering, Center for Advanced Aerospace Materials Pohang University of Science and Technology(POSTECH)) ;
  • Oh, Sang-Ho (Dept. of Materials Science and Engineering, Center for Advanced Aerospace Materials Pohang University of Science and Technology(POSTECH)) ;
  • Park, Chan-Gyung (Dept. of Materials Science and Engineering, Center for Advanced Aerospace Materials Pohang University of Science and Technology(POSTECH))
  • Published : 2002.05.01
Download PDF
⟨ Previous Next ⟩

Abstract

Keywords