Effect of Surface Roughness in Tunneling Magnetoresistance Using an Amorphous CoNbZr Under and Capping Layers

  • Chun, B.S. (Korea University) ;
  • Choi, B.S. (Korea University) ;
  • Lee, S.R. (Korea University) ;
  • Kim, Y.K. (Korea University)
  • Published : 2002.04.01