Characterization of hafnium and zirconium silicate films fabricated by plasma-enhanced chemical vapor deposition

  • Hiromitsu Kato (Department of Electrical, Electronics, and Computer Engineering, Waseda University) ;
  • Tomohiro Nango (Department of Electrical, Electronics, and Computer Engineering, Waseda University) ;
  • Takeshi Miyagawa (Department of Electrical, Electronics, and Computer Engineering, Waseda University) ;
  • Takahiro Katagiri (Department of Electrical, Electronics, and Computer Engineering, Waseda University) ;
  • Yoshimichi Ohki (Department of Electrical, Electronics, and Computer Engineering, Waseda University) ;
  • Seol, Kwang-Soo (RIKEN(The Institute of Physical and Chemical Research))
  • Published : 2002.11.01