Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Anti-fuse program circuits for configuration of the programmable logic device

  • Kim, Phil-Jung (Department of Internet Information, Sunghwa College) ;
  • Gu, Dae-Sung (Dept. of Electronic Engineering, Graduate School, Chosun University) ;
  • Jung, Rae-Sung (Dept. of Electronic Engineering, Graduate School, Chosun University) ;
  • Park, Hyun-Yong (Dept. of Electronic Engineering, Graduate School, Chosun University) ;
  • Kim, Jong-Bin (Dept. of Electronic Engineering, Graduate School, Chosun University)
  • Published : 2002.07.01
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Abstract

In this paper, we designed the anti-fuse program circuit, and there are an anti-fuse program/sense/latch circuit, a negative voltage generator, power-up circuit and etc. in this circuit. An output voltage of a negative voltage generator is about -4,51V. We detected certainly it regardless of simulation result power rise time or temperature change to detect the anti-fuse program state of an anti-fuse program/sense/latch circuit and were able to know what performed a steady action. And as a result of having done a simulation while will change a resistance value voluntarily in order to check an anti-fuse resistance characteristic of this circuit oneself, it recognized as a programmed anti-fuse until 23k$\Omega$, and we were able to know that this circuit was a lot of margin than general anti-fuse resistance 500$\Omega$. Therefore, the anti-fuse program circuit of this study showed that was able to apply for configuration of the programmable logic device.

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