Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2002.07a
- /
- Pages.304-306
- /
- 2002
A New Characterizing Method for Non-Rectangular Sag
Non-Rectangular Sag를 고려한 새로운 Sag의 평가 방법
-
Won, D.J.
(Seoul National University)
;
-
Chung, I.Y.
(Seoul National University)
;
- Kim, J.M. (Seoul National University) ;
- Ahn, S.J. (Seoul National University) ;
-
Moon, S.I.
(Seoul National University)
;
- Seo, J.C. (LG Industrial Systems) ;
- Choe, J.W. (LG Industrial Systems)
-
원동준
(서울대학교 전기.컴퓨터공학부)
;
-
정일엽
(서울대학교 전기.컴퓨터공학부)
;
- 김중문 (서울대학교 전기.컴퓨터공학부) ;
- 안선주 (서울대학교 전기.컴퓨터공학부) ;
-
문승일
(서울대학교 전기.컴퓨터공학부)
;
- 서장철 ((주)LG산전) ;
- 최종웅 ((주)LG산전)
- Published : 2002.07.10
Abstract
This paper presents a new method to characterize sag event. Power quality monitoring algorithm to analyze PQ problems is described. This paper shows that conventional characterizing method which makes use of only sag magnitude and sag duration has some limitations. It characterizes non-rectangular sag as more severe one. In addition, it can't count on voltage tolerance characteristics of each apparatus. In order to solve these problems, this paper present a new characterizing method and it properly characterizes non-rectangular sag considering the voltage tolerance characteristics.
Keywords