한국진공학회:학술대회논문집 (Proceedings of the Korean Vacuum Society Conference)
- 한국진공학회 2001년도 창립10주년 제20회 학술발표회
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- Pages.201-201
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- 2001
STM Observation Of Stress-Induced Leakage Current Sites In The Ultra Thin Oxide On Si Surface.
- Shin, Ji-Shik (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
- Jung, Jong-Hoon (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
- Moon, Ki-Young (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
- Ryu, Jea-Choon (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
- Lyo, In-Whan (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University)
- 발행 : 2001.02.22