한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
- /
- Pages.501-504
- /
- 2001
비정질 셀레늄 필름의 공명 비행시간 조사
Time of Fight Resonace Investigation of Amorphous Selenium Films
- 박지군 (인제대학교 의용공학과) ;
- 박성광 (인제대학교 의용공학과) ;
- 이동길 (인제대학교 의용공학과) ;
- 최장용 (인제대학교 의용공학과) ;
- 안상호 (인제대학교 의료영상연구소) ;
-
은충기
(인제대학교 의료영상연구소) ;
-
남상희
(인제대학교 의료영상연구소)
- Park, J.K. ;
- Park, S.K. ;
- Lee, D.G. ;
- Choi, J.Y. ;
- Ahn, S.H. ;
-
Eun, C.K.
;
-
Nam, S.H.
- 발행 : 2001.11.08
초록
We used time-of-flight method to analyze transport properties of charge carrier which is produced by X-ray exposure. It is the research of charge transport and specific property of trap that is performed in direct digital x-ray image receptor. But the results shows us different measurement value of electron and charge drift mobility and it is difficult to precise analysis about charge transport properties and trap mechanism. We measured transit time and drift mobility of charge carriers using time-of-flight method to evaluate the correlation of a-Se thickness change and electric field. We made a testing glass with a-Se of 400