대한기계학회:학술대회논문집 (Proceedings of the KSME Conference)
- 대한기계학회 2001년도 춘계학술대회논문집D
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- Pages.348-353
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- 2001
Michelson 간섭계를 응용한 미세 상변화 현상 계측
Probing of Microscale Phase-Change Phenomena Based on Michelson Interforometry
- Kim, Dong-Sik ;
- Park, Hee-K. (IBM Storage Technology Division) ;
- Grigoropoulos, Costas P. (Department of Mechanical Engineering, University of California at Berkeley)
- 발행 : 2001.06.27
초록
Experimental schemes that enable characterization of phase-change phenomena in the micro scale regime is essential for understanding the phase-change kinetics. Particularly, monitoring rapid vaporization on a submicron length scale is an important yet challenging task in a variety of laser-processing applications, including steam laser cleaning and liquid-assisted material ablation. This paper introduces a novel technique based on Michelson interferometry for probing the liquid-vaporization process on a solid surface heated by a KrF excimer laser pulse (