Temperature Dependence and Dielectric Properties in Semiconducting Shield of Power Cable

전력케이블용 반도전층의 유전특성과 온도의존성

  • Lee, Kwan-Woo (School of Electrical and Electronic eng., Wonkwang University) ;
  • Lee, Jong-Chan (School of Electrical and Electronic eng., Wonkwang University) ;
  • Park, Dae-Hee (School of Electrical and Electronic eng., Wonkwang University)
  • 이관우 (원광대학교 전기전자공학부) ;
  • 이종찬 (원광대학교 전기전자공학부) ;
  • 박대희 (원광대학교 전기전자공학부)
  • Published : 2001.11.03

Abstract

In this paper, to obtain the material properties through the semiconducting shields of 22kV XLPE power cable. the water absorption TGA DSC and dielectric properties were respectively measured between semiconducting shield and XLPE. Especially, dielectric properties were measured with temperature variation. Above result, the water absorption was 1200 ppm and the ratio of carbon black was 40% in semiconducting shields. The dielectric constant was $10^3{\sim}10^5$, $tan{\delta}$ was $10^2{\sim}10^3{\Omega}cm$ and volume resistivity was $280{\sim}2.8{\times}10^3$.

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