Proceedings of the Korean Society of Near Infrared Spectroscopy Conference (한국근적외분광분석학회:학술대회논문집)
- 2001.06a
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- Pages.1285-1285
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- 2001
Quantitative In-line NIR measurements of papers
- Schmidt, Angela (Bruker Optik GmbH, Rudolf-Plank-Strasse) ;
- Weiler, Helmut (Bruker Optik GmbH, Rudolf-Plank-Strasse)
- Published : 2001.06.01
Abstract
For NIR measurements of papers normally diffuse reflectance accessories are used which can provide a large sampling area. The in-line process control FT-NIR spectrometer MATRIX-E enables the contactless measurement of paper samples of low silicone coat weights on label-stocks in a paper converting factory. For this study concentrations of silicone between 0 and 2 g/
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