제어로봇시스템학회:학술대회논문집
- 제어로봇시스템학회 2001년도 ICCAS
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- Pages.118.3-118
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- 2001
Development of an Inspection System of Contact Light Emitting Device for Quality Control
- Lee, Jun-Ho (Sunmoon University) ;
- Kwon, Hyung-Kee (Sunmoon University) ;
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Ryu, Young-Kee
(Sunmoon University)
- 발행 : 2001.10.01
초록
CLED (Contact Light Emitting Device) has three layers consisting of a transparent electrode, a light emitting layer and a substrate. When the substrate of the CLED comes in contact with a fingerprint under AC input voltage, it makes an electric field between the fingerprint and the device. Due to the electric field, the light is emitted along the ridgeline of the fingerprint. The intensity along the ridge on the surface of the CLED increase in proportion to the electric field. To achieve uniform performance of fingerprint verification devices, inspection system of CLED for quality control were required. In this research, we proposed the factors for quality controls such as dimensions of the CLED, uniformity ...
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