Temperature dependence of magnetoresistance for tunnel junctions with high-power plasma-oxidized barriers : Effects of annealing

  • Lee, K.I. (KIST) ;
  • Lee, J.H. (KIST) ;
  • K.H. Shin (KIST) ;
  • J.G. Ha (Kwangwoon university) ;
  • K. Rhie (Korea university) ;
  • Lee, B.C. (Inha university)
  • Published : 2001.10.01