Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Latent Charge Erasing Technique for a-Se Digital X-ray Detector

비정질 셀레늄 디지털 X선 검출기에 대한 잔류 전하 제거 기술

  • 강상식 (인제대학교 의용공학과) ;
  • 최장용 (인제대학교 의용공학과) ;
  • 박지군 (인제대학교 의용공학과) ;
  • 조진욱 (인제대학교 의용공학과) ;
  • 문치웅 (인제대학교 의료영상연구소)
  • Published : 2001.11.01
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Abstract

Currently there is much interested in removing latent charge that is caused to latent image effect and blurring of obtained image as well as reduction of x-ray conversion efficiency in digital radiography system. To remove latent charge a-Se film is irradiated by light with 3500 lux using halogen lamp and optical fiber. We measured dark current and photosensitivity to analyze removing effect of latent charge, then compared with and without light erasing method. The reduction of measured signal due to latent charge effect was 32.3%, and the removal effect of latent charge by using light erase method was its 95.5%.

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