Resistance development in Au/YBCO thin film meander lines during quench

금/YBCO 박막에서의 quench 저항 발생

  • Published : 2000.08.16

Abstract

We investigated resistance development in Au/YBCO thin film meander lines during quench. The meander lines were fabricated by coating YBCO films insitu with a gold layer and patterning them by photolithography. The center stripe quenched fastest even though the flux flow resistance that appeared upon the current passing the critical current was uniform. Quench started at an area of the center stripe and propagate both through the gold layer and the sapphire substrate. Quench propagation speed was uniform and 60 cm/s at 30 V$_{rms}$.

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