Effects of post-annealing temperature of CeO$_2$ buffer layers on the surface morphology, structures and microwave properties of YBa$_2$ Cu$_3$ O$_{7-{\delta}}$ films on sapphire
- Yang, W.I. (Department of Physics and Center for Advanced Materials and Devices) ;
- Lee, J.H. (Department of Physics and Center for Advanced Materials and Devices) ;
- Ryu, J.S. (Department of Physics and Center for Advanced Materials and Devices) ;
- Ko, Y.B. (Department of Physics and Center for Advanced Materials and Devices) ;
- Chung, Y.S. (Department of Physics and Center for Advanced Materials and Devices) ;
- Hur, Jung (Department of Electronic Engineering Konkuk University) ;
- Lee, Sang-Young (Department of Physics and Center for Advanced Materials and Devices)
- Published : 2000.08.16
Abstract
Effects of the post-annealing temperature of CeO
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