Proceedings of the Korean Reliability Society Conference (한국신뢰성학회:학술대회논문집)
- 2000.11a
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- Pages.373-373
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- 2000
Bayesian Burn-in Procedures for LFPs with the Mixed Binomial Prior Distribution for the Number of Defectives
Abstract
Bum-in procedures are developed far limited failure populations in which defective products fail soon after they are put in operation and non-defective ones never fail during the technological life of the products. The situation where products are produced from a production process with variable fraction defective is considered. Bum-in schemes guaranteeing pre-specified outgoing quality of products are derived using the mixed binomial prior distribution for the number of defectives in a batch.
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