대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2000년도 하계종합학술대회 논문집(2)
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- Pages.137-140
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- 2000
신호 전이그래프를 이용한 비동기회로의 상위수준 테스트 생성
High-Level Test Generation for Asynchronous Circuits Using Signal Transition Graph
초록
In this paper, we have proposed an efficient test generation method for asynchronous circuits. The test generation is based on specification level, especially on Signal Transition Graph(STG)〔1〕 which is a kind of specification method for asynchronous circuits. To conduct a high-level test generation, we have defined a high-level fault model, called single State Transition Fault(STF) model on STG and proposed a test generation algorithm for STF model. The effectiveness of the proposed fault model and its test generation algorithm is shown by experimental results on a set of benchmarks given in the form of STG. Experimental results show that the generated test for the proposed fault model achieves high fault coverage over single input stuck-at fault model with low cost. We have also proposed extended STF model with additional gate-level information to achieve higher fault coverage in cost of longer execution time.
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