Measurements of Dielectric constant and Loss tangent of Microwave Substrates

초고주파 대역에서의 기판의 유전상수 및 손실계수 측정

In this paper, the method for dielectric constant and less tangent measurements of microwave substrates using a microstrip line is presented. The two samples of an open-ended line and a short-ended tine are made and complex propagation constant is evaluated from the one-port scattering parameter measurements. This method has been automated fully using a personal computer and a vector network analyzer.