Static and Dynamic Testing Technique of Inductor Short Turn

  • Piyarat, W. (Department of Electrical Engineering, Faculty of Engineering, Srinakharinwirot University) ;
  • Tipsuwanporn, V. (Faculty of Engineering, King Mongkut’s Institute of Technology Ladkrabang) ;
  • Tarasantisuk, C. (Faculty of Engineering, King Mongkut’s Institute of Technology Ladkrabang) ;
  • Kummool, S. (Faculty of Engineering, King Mongkut’s Institute of Technology Ladkrabang) ;
  • Im, T.Sum (Department of Electrical Engineering, Faculty of Engineering, Srinakharinwirot University)
  • Published : 1999.10.01

Abstract

This topic presents an inductor short turn testing. From the rudimentary principles, the quality factor(Q) decreases due to inductor short turn. Frequency response varies because of the variation of circuit inductance and resistance. In general, short turn circuit testing is performed by comparing the ratio of an inductance and resistance of inductor in that particular circuit. An alternative method can be done by considering the response of second order circuit which can give both dynamic and static testing, whereas static testing give an error results not more than 2 turns. For dynamic testing, the result is more accurate, which can test fur the short turn number form 1 turn onward.

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