Testing for Speed-Independent Asynchronous Circuits Using the Self-Checking Property

자가검사특성을 이용한 속도독립 비동기회로의 테스팅

In this paper, we have proposed a testing methodology for Speed-Independent asynchronous control circuits using the self-checking property where the circuit detects certain classes of faults during normal operation. To exploit self-checking properties of Speed-Independent circuits, the Proposed methodology generates tests from the specification of the target circuit which describes the behavior of the circuit. The generated tests are applied to a fault-free and a faulty circuit, and target faults can be detected by the comparison of the outputs of the both circuits. For the purpose of efficient comparison, reachability information of the both circuits in the form of BDD's is used and operations are conducted by BDD manipulations. The identification for undetectable faults in testing is also used to increase efficiency of the proposed methodology. The proposed identification uses only topological information of the target circuit and reachability information of the good circuit which was generated in the course of preprocess. Experimental results show that high fault coverage is obtained for synthesized Speed-Independent circuits and the use of the identification process decreases the number of tests and execution time.